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H. Koop

Identifiers

  • name variant H. Koop 0.60 · backfill

Papers (1)

  1. In-situ direct visualization of irradiated e-beam patterns on unprocessed resists using atomic force microscopy cond-mat.mtrl-sci · 2010 · author #1

Mentions

  • 1003.0796 #1 · backfill · confidence 0.70 H. Koop

Frequent Coauthors