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Lert Chayanun

Identifiers

  • name variant Lert Chayanun 0.60 · backfill

Papers (3)

  1. Characterization of process-related interfacial dielectric loss in aluminum-on-silicon by resonator microwave measurements, materials analysis, and imaging quant-ph · 2024 · author #1
  2. Mitigation of interfacial dielectric loss in aluminum-on-silicon superconducting qubits quant-ph · 2023 · author #4
  3. Experimentally verified, fast analytic and numerical design of superconducting resonators in flip-chip architectures quant-ph · 2023 · author #5

Mentions

  • 2403.00723 #1 · arxiv_oai · confidence 0.70 Lert Chayanun
  • 2310.06797 #4 · arxiv_oai · confidence 0.70 Lert Chayanun
  • 2305.05502 #5 · arxiv_oai · confidence 0.70 Lert Chayanun

Frequent Coauthors