Christopher James Kirkham

Identifiers

• name variant Christopher James Kirkham 0.60 · backfill

Papers (2)

1. Intrinsic origin of electron scattering at 4H-SiC(0001)/SiO$_2$ cond-mat.mtrl-sci · 2016 · author #2
2. Interplay between O defects and SiC stacking at the SiC/SiO$_2$ interface cond-mat.mtrl-sci · 2015 · author #1

Mentions

• 1508.01590 #1 · backfill · confidence 0.70 Christopher James Kirkham

Frequent Coauthors

• Tomoya Ono 2 shared papers
• Shigeru Iwase 1 shared papers