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Z. Osvath

Identifiers

  • name variant Z. Osvath 0.60 · backfill

Papers (1)

  1. Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy cond-mat.mes-hall · 2008 · author #2

Mentions

  • 0812.0690 #2 · backfill · confidence 0.70 Z. Osvath

Frequent Coauthors