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A.K.Tyagi

Identifiers

  • name variant A.K.Tyagi 0.60 · backfill

Papers (2)

  1. A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures cond-mat.mtrl-sci · 2016 · author #6
  2. Temperature dependence of dielectric constants in Titanium Nitride cond-mat.mtrl-sci · 2013 · author #5

Mentions

  • 1308.0470 #5 · backfill · confidence 0.70 A.K.Tyagi

Frequent Coauthors