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Eckhart Fretwurst (2) ((1) National Institute of Materials Physics NIMP

Identifiers

  • name variant Eckhart Fretwurst (2) ((1) National Institute of Materials Physics NIMP 0.60 · backfill

Papers (1)

  1. Radiation Induced Point and Cluster-Related Defects with Strong Impact to Damage Properties of Silicon Detectors physics.ins-det · 2009 · author #4

Mentions

  • 0907.3050 #4 · backfill · confidence 0.70 Eckhart Fretwurst (2) ((1) National Institute of Materials Physics NIMP

Frequent Coauthors