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Martin Kaibel

Identifiers

  • name variant Martin Kaibel 0.60 · backfill

Papers (1)

  1. Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality cs.AR · 2007 · author #3

Mentions

  • 0710.4763 #3 · backfill · confidence 0.70 Martin Kaibel

Frequent Coauthors