M. Henzler

Identifiers

• name variant M. Henzler 0.60 · backfill

Papers (2)

1. A new LEED Instrument for Quantitative Spot Profile Analysis cond-mat.mtrl-sci · 2015 · author #3
2. Anomalous thickness dependence of the Hall effect in ultrathin Pb layers on Si(111) cond-mat.mtrl-sci · 2002 · author #2

Mentions

• 1501.07389 #3 · backfill · confidence 0.70 M. Henzler

Frequent Coauthors

• G. Meyer 1 shared papers
• H. Pfnuer 1 shared papers
• I. Vilfan 1 shared papers
• O. Pfennigstorf 1 shared papers
• U. Scheithauer 1 shared papers