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J. Colchero

Identifiers

  • name variant J. Colchero 0.60 · backfill

Papers (3)

  1. In-situ characterization of contamination within an Atomic Force Microscope tip-sample system cond-mat.mes-hall · 2017 · author #3
  2. Charging of highly resistive granular metal films cond-mat.mes-hall · 2017 · author #4
  3. Thermal frequency noise in low oscillation amplitude Dynamic Scanning Force Microscopy cond-mat.mes-hall · 2010 · author #1

Mentions

  • 1002.4284 #1 · backfill · confidence 0.70 J. Colchero

Frequent Coauthors