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Omur E. Dagdeviren

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Papers (5)

  1. Amplitude dependence of resonance frequency and its consequences for scanning probe microscopy physics.app-ph · 2018 · author #1
  2. Limit of Temporal Resolution in Atomic Force Microscopy: How fast can we image with atomically-engineered tips while preserving picometer range spatial resolution? physics.app-ph · 2018 · author #1
  3. Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors physics.app-ph · 2018 · author #1
  4. Suppression of the Spectral Weight of Topological Surface States on the Nanoscale via Local Symmetry Breaking cond-mat.mtrl-sci · 2018 · author #1
  5. The role of double TiO2 layers at the interface of FeSe/SrTiO3 superconductors cond-mat.str-el · 2016 · author #9

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