A spiking neural network achieves about 98% wafer-map defect classification accuracy on WM-811k, beating reported DNN baselines especially on rare defect patterns.
A light-weight neural network for wafer map classification based on data augmentation,
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
citation-role summary
baseline 1
citation-polarity summary
fields
cs.NE 1years
2024 1verdicts
CONDITIONAL 1roles
baseline 1polarities
baseline 1representative citing papers
citing papers explorer
-
Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification
A spiking neural network achieves about 98% wafer-map defect classification accuracy on WM-811k, beating reported DNN baselines especially on rare defect patterns.