Ultrahigh-resolution X-ray Thomson scattering data on single-crystal silicon reveal strong orientation dependence of the inelastic spectrum, reproduced by TDDFT only after fitting the unknown crystal rotation angle.
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Strong geometry dependence of the X-ray Thomson Scattering Spectrum in single crystal silicon
Ultrahigh-resolution X-ray Thomson scattering data on single-crystal silicon reveal strong orientation dependence of the inelastic spectrum, reproduced by TDDFT only after fitting the unknown crystal rotation angle.