A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.
Impacts of Process Variations and Aging on Lifetime Reliability of Flip -Flops: A Comparative Analysis
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Building Reliable Arithmetic Multipliers Under NBTI Aging and Process Variations
A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.