Demonstrates x-ray interferometry with one magnetic-film-covered slit plus XMCD to extract real and imaginary parts of the complex refractive index from magnetization-induced fringe shifts.
∆Y extraction The workflow for extracting the ∆ Y parameter is sum- marized in Fig
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Magnetically modified double slit based x-ray interferometry
Demonstrates x-ray interferometry with one magnetic-film-covered slit plus XMCD to extract real and imaginary parts of the complex refractive index from magnetization-induced fringe shifts.