In situ SEM-DIC and EBSD measurements on cold-worked AA-5052 show crack arrest coincides with divergence of elastic and elastoplastic energy release rates as the crack-tip process zone expands beyond grain size.
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Sankey diagrams summarize the birth, merging, and disappearance of high-strain regions in time-varying DIC strain fields by tracking connected components via spatial overlap.
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In situ elucidation of mechanisms governing crack transition to plasticity arrest
In situ SEM-DIC and EBSD measurements on cold-worked AA-5052 show crack arrest coincides with divergence of elastic and elastoplastic energy release rates as the crack-tip process zone expands beyond grain size.
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Summarizing Time-Varying Digital Image Correlation Strain Fields Using Sankey Diagrams
Sankey diagrams summarize the birth, merging, and disappearance of high-strain regions in time-varying DIC strain fields by tracking connected components via spatial overlap.