Clustering 4D-STEM diffraction data from Ge-Sb-Te with PCA, UMAP, and k-means yields four spatial clusters with distinct elemental intensity signatures.
X-ray diffraction (XRD) techniques for materials characterization
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Protocol for Clustering 4DSTEM Data for Phase Differentiation in Glasses
Clustering 4D-STEM diffraction data from Ge-Sb-Te with PCA, UMAP, and k-means yields four spatial clusters with distinct elemental intensity signatures.