Subgap defect density-of-state spectra of SnO and Cu2O p-type thin-film transistors resolve metal-vacancy and oxygen-related defect peaks that control p-type operation.
The diffraction-limited laser illuminates a tin or copper oxide active channel from the top side through the thin passivation layer of alu- minum oxide
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Defect density of states of tin oxide and copper oxide p-type thin-film transistors
Subgap defect density-of-state spectra of SnO and Cu2O p-type thin-film transistors resolve metal-vacancy and oxygen-related defect peaks that control p-type operation.