A cryogenic widefield NV-diamond microscope images flux trapping in Nb films and patterned strips, revealing a crossover in vortex expulsion behavior between 10 and 20 μm widths that agrees with theory.
Flux Trapping Characterization for Superconducting Electronics Using a Cryogenic Widefield NV-Diamond Microscope
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Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope
A cryogenic widefield NV-diamond microscope images flux trapping in Nb films and patterned strips, revealing a crossover in vortex expulsion behavior between 10 and 20 μm widths that agrees with theory.