A new electron microscopy technique images transverse optical near-field components and ponderomotive potentials by detecting laser-induced deflection of a scanning electron beam, without spectral filtering.
Energy-filtered dark-field imaging of nanoparticles by PINEM in 4D electron microscopy
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Ultrafast 4D scanning transmission electron microscopy for imaging of localized optical fields
A new electron microscopy technique images transverse optical near-field components and ponderomotive potentials by detecting laser-induced deflection of a scanning electron beam, without spectral filtering.