Novel 14 mm diameter silicon nitride vacuum windows of 200 nm and 300 nm thickness were fabricated to withstand >1 bar pressure difference and showed X-ray transparency from 50 eV to 15 keV at SOLEIL synchrotron comparable to theoretical expectations.
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Characterization of large diameter ultra-thin vacuum windows for soft X-ray applications
Novel 14 mm diameter silicon nitride vacuum windows of 200 nm and 300 nm thickness were fabricated to withstand >1 bar pressure difference and showed X-ray transparency from 50 eV to 15 keV at SOLEIL synchrotron comparable to theoretical expectations.