A 63-day cosmic ray scattering campaign with an RPC muon tomography system measures secondary cosmic ray abundances (e.g., electrons at ~2% precision) via template fits to scattering angles and sets a 95% CL upper limit of 1.61 × 10^{-17} cm² on the elastic scattering cross section for 1 GeV muon-ph
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Probing Cosmic Ray Composition and Muon-philic Dark Matter via Muon Tomography
A 63-day cosmic ray scattering campaign with an RPC muon tomography system measures secondary cosmic ray abundances (e.g., electrons at ~2% precision) via template fits to scattering angles and sets a 95% CL upper limit of 1.61 × 10^{-17} cm² on the elastic scattering cross section for 1 GeV muon-ph