STM/STS resolves two defect types in CrSBr; DFT-simulated images identify the type-2 defect as a b-axis-aligned double sulfur vacancy.
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Visualization of Defect Electronic States in Layered Semiconductor CrSBr
STM/STS resolves two defect types in CrSBr; DFT-simulated images identify the type-2 defect as a b-axis-aligned double sulfur vacancy.