Buried TiN bottom gates with 60 nm pitch, made by trench filling and mechanical polishing, electrostatically define quantum dots in InAs nanowires, showing Coulomb blockade at cryogenic temperatures.
Fabrication and characterization of InAs nanowire-based quantum dot structures utilizing buried bottom gates
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abstract
Semiconductor nanowires can be utilized to create quantum dot qubits. The formation of quantum dots is typically achieved by means of bottom gates created by a lift-off process. As an alternative, we fabricated flat buried bottom gate structures by filling etched trenches in a Si substrate with sputtered TiN, followed by mechanical polishing. This method achieved gate line pitches as small as 60 nm. The gate fingers have low gate leakage. As a proof of principle, we fabricated quantum dot devices using InAs nanowires placed on the gate fingers. These devices exhibit single electron tunneling and Coulomb blockade.
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cond-mat.mes-hall 1years
2024 1verdicts
CONDITIONAL 1representative citing papers
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Fabrication and characterization of InAs nanowire-based quantum dot structures utilizing buried bottom gates
Buried TiN bottom gates with 60 nm pitch, made by trench filling and mechanical polishing, electrostatically define quantum dots in InAs nanowires, showing Coulomb blockade at cryogenic temperatures.