First observation of a second-order x-ray-optical sum-frequency sideband in centrosymmetric silicon, with polarization data that reveal the microscopic origin of the local nonlinear response.
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Second-order microscopic nonlinear susceptibility in a centrosymmetric material: application to imaging valence electron motion
First observation of a second-order x-ray-optical sum-frequency sideband in centrosymmetric silicon, with polarization data that reveal the microscopic origin of the local nonlinear response.