Optical measurements on unfinished perovskite cells can predict the ranking of open-circuit voltages across different hole-transport and annealing conditions.
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We observe only small changes in the predicted VOC for active layers annealed at different conditions
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Predicting Trends in $V_{OC}$ Through Rapid, Multimodal Characterization of State-of-the-Art p-i-n Perovskite Devices
Optical measurements on unfinished perovskite cells can predict the ranking of open-circuit voltages across different hole-transport and annealing conditions.