Dislocation pile-up theory yields a singular integro-differential equation whose numerical solutions show residual stress profiles in thin films depend strongly on thickness-to-width ratio and initial stress distribution, always requiring mixed-sign Burgers vectors.
X-ray residual stress analysis on multilayer systems: an approach for depth-resolved data evaluation
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Residual stress gradient in a thin film within the dislocation pile-up theory
Dislocation pile-up theory yields a singular integro-differential equation whose numerical solutions show residual stress profiles in thin films depend strongly on thickness-to-width ratio and initial stress distribution, always requiring mixed-sign Burgers vectors.