Strongly coupled interface defects that shorten qubit lifetimes are localized within 500 nm of the Josephson junction and correlate with longer liftoff-fabricated leads.
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Statistics of Strongly Coupled Defects in Superconducting Qubits
Strongly coupled interface defects that shorten qubit lifetimes are localized within 500 nm of the Josephson junction and correlate with longer liftoff-fabricated leads.