Hardware impairments modeled as random multiplicative errors in the BD-RIS scattering matrix degrade channel estimation NMSE, with off-diagonal (mutual impedance) errors being the most harmful and able to make conventional RIS outperform BD-RIS at high SNR.
Modeling and architecture design of reconfigurable intelligent surfaces using scattering parameter network analysis,
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Performance Evaluation of Beyond Diagonal RIS under Hardware Impairments
Hardware impairments modeled as random multiplicative errors in the BD-RIS scattering matrix degrade channel estimation NMSE, with off-diagonal (mutual impedance) errors being the most harmful and able to make conventional RIS outperform BD-RIS at high SNR.