Yee FDTD simulations of normal-incidence plane waves on dielectric and magnetic interfaces exhibit systematic errors due to an implicit one-cell transition layer, quantified through discrete Fresnel coefficients and error estimates depending on impedance contrast and Courant number.
(1972) Computation of Combined Refraction — Diffraction
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Accuracy of the Yee FDTD Scheme for Normal Incidence of Plane Waves on Dielectric and Magnetic Interfaces
Yee FDTD simulations of normal-incidence plane waves on dielectric and magnetic interfaces exhibit systematic errors due to an implicit one-cell transition layer, quantified through discrete Fresnel coefficients and error estimates depending on impedance contrast and Courant number.