Dark field TEM intensity can be quantitatively mapped to local 3D atomic positions and interlayer spacing in reconstructed twisted bilayer crystals.
Atomic and electronic reconstruction at the van der Waals interface in twisted bilayer graphene,
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Untangling 3D atomic reconstruction in twisted bilayer 2D crystals via dark field transmission electron microscopy
Dark field TEM intensity can be quantitatively mapped to local 3D atomic positions and interlayer spacing in reconstructed twisted bilayer crystals.