The CE-65v2 MAPS prototype, especially the standard process variant, achieves better than 3 micrometer spatial resolution with over 99 percent hit efficiency in test-beam measurements.
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Performance studies of the CE-65v2 MAPS prototype structure
The CE-65v2 MAPS prototype, especially the standard process variant, achieves better than 3 micrometer spatial resolution with over 99 percent hit efficiency in test-beam measurements.