By detecting recoil-projectile coincidences in 40 keV Xe transmission, carbon and hydrogen contamination on freestanding graphene is quantified, with PMMA-free transfer plus 400 °C annealing reaching nearly clean single-layer graphene.
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Quantitative Analysis of Composition and Contamination of Atomically Thin Materials by Recoil-Projectile Coincidence in Ion Transmission
By detecting recoil-projectile coincidences in 40 keV Xe transmission, carbon and hydrogen contamination on freestanding graphene is quantified, with PMMA-free transfer plus 400 °C annealing reaching nearly clean single-layer graphene.