An integrated Deep TDA plus self-supervised plus transfer learning framework clusters semiconductor wafer maps into groups that visually match known defect patterns, without using labels during training.
Integration of AI and Machine Learning in Semiconductor Manufacturing for Defect Detection and Yield Improvement
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Advanced Clustering Framework for Semiconductor Image Analytics Integrating Deep TDA with Self-Supervised and Transfer Learning Techniques
An integrated Deep TDA plus self-supervised plus transfer learning framework clusters semiconductor wafer maps into groups that visually match known defect patterns, without using labels during training.