Exposure-integrated Gaussian processes allow prediction of both latent stellar signals and instrument-specific binned versions, supporting combination of overlapping EPRV datasets with varying exposure times.
M., Krishnan, H., Risser, M
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Exposure-averaged Gaussian Processes for Combining Overlapping Datasets
Exposure-integrated Gaussian processes allow prediction of both latent stellar signals and instrument-specific binned versions, supporting combination of overlapping EPRV datasets with varying exposure times.
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