AUGER steers an LLM's attention toward predicted defective lines and thereby triggers 84 of 723 Defects4J bugs, outperforming five test-generation baselines.
Deeplocalize: Fault localization for deep neural networks,
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
citation-role summary
background 1
citation-polarity summary
fields
cs.SE 1years
2024 1verdicts
CONDITIONAL 1roles
background 1polarities
unclear 1representative citing papers
citing papers explorer
-
What You See Is What You Get: Attention-based Self-guided Automatic Unit Test Generation
AUGER steers an LLM's attention toward predicted defective lines and thereby triggers 84 of 723 Defects4J bugs, outperforming five test-generation baselines.