Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.
(B1), n = ( n1, n2, n3) the unit propagation vector, and ρ the mass density
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Elastic and structural anisotropy in silica thin films for gravitational-wave detectors
Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.