Combining three orthogonal 2D EBSD sections yields qualitatively correct grain boundary plane distributions for strongly textured synthetic microstructures, though anisotropy is overestimated and alignment with texture axes is critical.
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Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps
Combining three orthogonal 2D EBSD sections yields qualitatively correct grain boundary plane distributions for strongly textured synthetic microstructures, though anisotropy is overestimated and alignment with texture axes is critical.