Systematic single-pulse EMFI experiments on the NCS2 with ResNet and VGG models identify persistent accuracy degradation below 5% top-1 that survives until model reload and can be triggered on idle loaded devices.
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Characterizing the Fault Response of the Intel Neural Compute Stick 2 Under Single-Pulse Electromagnetic Fault Injection
Systematic single-pulse EMFI experiments on the NCS2 with ResNet and VGG models identify persistent accuracy degradation below 5% top-1 that survives until model reload and can be triggered on idle loaded devices.