A novel optimization algorithm reconstructs 3D refractive index in reflection-mode microscopy by exploiting multiply-scattered waves from uncontrolled background structures, using weighted time loss, positivity constraints, and total variation regularization, validated on simulations.
Reflection measurement of the scattering mean free path at the onset of multiple scattering
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Taking advantage of multiple scattering for Optical Reflection Tomography
A novel optimization algorithm reconstructs 3D refractive index in reflection-mode microscopy by exploiting multiply-scattered waves from uncontrolled background structures, using weighted time loss, positivity constraints, and total variation regularization, validated on simulations.