Temperature-dependent smearing of full EBSD patterns, quantified by radial Fourier analysis, yields roughly 0.14% per K sensitivity and about 13 K uncertainty in 10 seconds on silicon, enabling SEM-based thermal mapping.
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Fast nanothermometry based on direct electron detection of electron backscattering diffraction patterns
Temperature-dependent smearing of full EBSD patterns, quantified by radial Fourier analysis, yields roughly 0.14% per K sensitivity and about 13 K uncertainty in 10 seconds on silicon, enabling SEM-based thermal mapping.