A linear MMV-based inverse scattering model with joint sparsity regularization is introduced for single-frequency imaging of highly conductive objects, showing higher resolution than linear sampling methods on synthetic and Fresnel data.
Evolutionary opti- mization as applied to inverse scattering problems
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A Linear Model for Microwave Imaging of Highly Conductive Scatterers
A linear MMV-based inverse scattering model with joint sparsity regularization is introduced for single-frequency imaging of highly conductive objects, showing higher resolution than linear sampling methods on synthetic and Fresnel data.