A local third-harmonic AC probe was developed and applied to measure Hc1 in NbN-SiO2 multilayers on Nb for varying NbN thicknesses, to test thickness dependence predicted by theory.
Lower Critical Field Mea surement System based on Third -Harmonic Method for Superconducting RF Materials
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Lower critical field measurement of NbN multilayer thin film superconductor at KEK
A local third-harmonic AC probe was developed and applied to measure Hc1 in NbN-SiO2 multilayers on Nb for varying NbN thicknesses, to test thickness dependence predicted by theory.