Experimental SiN photonic MZI mesh PUF with numerical quantum single-photon readout protocol yielding equal error rates down to 10^-14.
Measurements and Modeling of Atomic‐Scale Sidewall Roughness and Losses in Integrated Photonic Devices,
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Quantum-Secure Physical Unclonable Function enabled by Silicon Photonics Integrated Circuits
Experimental SiN photonic MZI mesh PUF with numerical quantum single-photon readout protocol yielding equal error rates down to 10^-14.