An open-source ray-tracing model and calibration workflow lets electron microscopists predict lens settings for new condenser and projector modes, tested on one Nion STEM.
Transmission Electron Microscopy and Diffractometry of Materials , ISBN =
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A versatile generalized digital twin for Electron Microscopy
An open-source ray-tracing model and calibration workflow lets electron microscopists predict lens settings for new condenser and projector modes, tested on one Nion STEM.