s-SNOM line profiles across metal-dielectric boundaries are asymmetric due to near-field screening by the metal, and ultra-sharp tips can reduce the apparent boundary width to about 5 nm.
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Understanding the image contrast of material boundaries in IR nanoscopy reaching 5 nm spatial resolution
s-SNOM line profiles across metal-dielectric boundaries are asymmetric due to near-field screening by the metal, and ultra-sharp tips can reduce the apparent boundary width to about 5 nm.