SiC micropipe sidewalls contain amphoteric giant traps formed by donor and acceptor deep levels that drive trap-assisted leakage, characterized via a new multiple-reflection confocal spectromicroscopy approach.
Enhancement of donor -acceptor pair emissions in colloidal AgInS 2 quantum dots with high concentrations of defects
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2026 1verdicts
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Unraveling the Defect Physics of SiC Micropipe Sidewalls by Non-Line-of-Sight Confocal Spectromicroscopy: Amphoteric Giant Traps
SiC micropipe sidewalls contain amphoteric giant traps formed by donor and acceptor deep levels that drive trap-assisted leakage, characterized via a new multiple-reflection confocal spectromicroscopy approach.