Beam-offset ultrafast x-ray diffraction extracts in-plane thermal conductivity and thermal boundary conductance in GaN-on-Si films and images asymmetric heat flow at a wrinkle defect.
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Spatiotemporal Mapping of Anisotropic Thermal Transport in GaN Thin Films via Ultrafast X-ray Diffraction
Beam-offset ultrafast x-ray diffraction extracts in-plane thermal conductivity and thermal boundary conductance in GaN-on-Si films and images asymmetric heat flow at a wrinkle defect.