Axial transmittance spectra of a chiral sculptured thin film yield ambiguous fits to a nominal structure-property model; non-axial measurements resolve the ambiguity.
Title resolution pending
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
physics.optics 1years
2019 1verdicts
UNVERDICTED 1representative citing papers
citing papers explorer
-
On Calibration of a Nominal Structure-Property Relationship Model for Chiral Sculptured Thin Films by Axial Transmittance Measurements
Axial transmittance spectra of a chiral sculptured thin film yield ambiguous fits to a nominal structure-property model; non-axial measurements resolve the ambiguity.