Contact-resistance detection of the minigap in Al-Bi2Te3-Al Josephson junctions remains valid under rf irradiation, with the rf-broadened gap feature reproduced by an RSJ-plus-BTK simulation.
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Probing the minigap in topological insulator-based Josephson junctions under radio frequency irradiation
Contact-resistance detection of the minigap in Al-Bi2Te3-Al Josephson junctions remains valid under rf irradiation, with the rf-broadened gap feature reproduced by an RSJ-plus-BTK simulation.