An analytical inversion of the modified Kratzer model extracts bandgap, screening length, exciton mass, and dielectric constant of monolayer TMDCs from three exciton energies plus magnetoexciton shifts.
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Analytical Retrieval of Material Parameters in Monolayer Transition-Metal Dichalcogenides Based on a Solvable Exciton Model
An analytical inversion of the modified Kratzer model extracts bandgap, screening length, exciton mass, and dielectric constant of monolayer TMDCs from three exciton energies plus magnetoexciton shifts.